Search results
Electronic Materials Letters > 2019 > 15 > 5 > 562-571
Microelectronics Reliability > 2017 > 79 > C > 32-37
2016 IEEE International Reliability Physics Symposium (IRPS) > PA-3-1 - PA-3-4
Journal of Electronic Materials > 2016 > 45 > 1 > 57-68
2015 International 3D Systems Integration Conference (3DIC) > TS7.4.1 - TS7.4.4
Microelectronics Reliability > 2015 > 55 > 2 > 432-441
Microelectronic Engineering > 2014 > 120 > Complete > 138-145
IEEE Transactions on Components, Packaging and Manufacturing Technology > 2014 > 4 > 12 > 1914 - 1924
Microelectronic Engineering > 2013 > 107 > Complete > 107-113
IEEE Transactions on Components, Packaging and Manufacturing Technology > 2013 > 3 > 11 > 1960 - 1970
IEEE Transactions on Components, Packaging and Manufacturing Technology > 2012 > 2 > 9 > 1412 - 1419
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2012 > 20 > 1 > 186 - 191