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Integration, the VLSI Journal > 2017 > 58 > C > 430-437
Microelectronics Reliability > 2016 > 64 > C > 199-203
2013 International SoC Design Conference (ISOCC) > 241 - 244
Microprocessors and Microsystems > 2013 > 37 > 4-5 > 494-504
2009 IEEE International SOC Conference (SOCC) > 223 - 226