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IEEE Transactions on Electron Devices > 2015 > 62 > 2 > 485 - 492
IEEE Electron Device Letters > 2014 > 35 > 3 > 396 - 398
2012 IEEE International Reliability Physics Symposium (IRPS) > 3B.4.1 - 3B.4.6
IEEE Transactions on Device and Materials Reliability > 2012 > 12 > 1 > 94 - 100
IEEE Electron Device Letters > 2011 > 32 > 6 > 791 - 793