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IEEE Transactions on Device and Materials Reliability > 2013 > 13 > 4 > 515 - 523
2011 International Reliability Physics Symposium > XT.8.1 - XT.8.6
2009 IEEE International Reliability Physics Symposium > 1002 - 1004
IEEE Electron Device Letters > 2009 > 30 > 9 > 978 - 980