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IEEE Transactions on Electron Devices > 2017 > 64 > 5 > 2099 - 2105
IEEE Transactions on Electron Devices > 2017 > 64 > 5 > 2092 - 2098
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 4 > 541 - 548
2016 IEEE International Reliability Physics Symposium (IRPS) > 5A-3-1 - 5A-3-7
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 3 > 352 - 358
IEEE Transactions on Device and Materials Reliability > 2013 > 13 > 4 > 497 - 506
IEEE Transactions on Electron Devices > 2013 > 60 > 1 > 405 - 412
IEEE Transactions on Electron Devices > 2013 > 60 > 1 > 396 - 404
IEEE Transactions on Electron Devices > 2012 > 59 > 6 > 1592 - 1598
IEEE Transactions on Electron Devices > 2012 > 59 > 1 > 72 - 78
2011 International Conference on Multimedia Technology > 6660 - 6661
2011 International Reliability Physics Symposium > 6A.4.1 - 6A.4.6
2011 International Reliability Physics Symposium > CD.1.1 - CD.1.6
IEEE Electron Device Letters > 2011 > 32 > 3 > 255 - 257
2010 International Electron Devices Meeting > 4.1.1 - 4.1.4