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2013 IEEE International Reliability Physics Symposium (IRPS) > XT.4.1 - XT.4.9
IEEE Electron Device Letters > 2013 > 34 > 12 > 1476 - 1478
2011 International Reliability Physics Symposium > XT.8.1 - XT.8.6
IEEE Transactions on Electron Devices > 2011 > 58 > 5 > 1490 - 1498
2009 IEEE International Reliability Physics Symposium > 1023 - 1027
2009 Spanish Conference on Electron Devices > 156 - 159
IEEE Electron Device Letters > 2009 > 30 > 9 > 978 - 980
IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 2 > 106 - 114
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 1 > 14 - 21
IEEE Electron Device Letters > 2008 > 29 > 3 > 269 - 272
2007 IEEE International Electron Devices Meeting > 801 - 804
IEEE Transactions on Electron Devices > 2007 > 54 > 3 > 524 - 530
IEEE Transactions on Device and Materials Reliability > 2007 > 7 > 1 > 119 - 129