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2013 Proceedings of the ESSCIRC (ESSCIRC) > 315 - 318
2012 International Electron Devices Meeting > 25.6.1 - 25.6.4
2012 IEEE International Reliability Physics Symposium (IRPS) > 5C.2.1 - 5C.2.5
2011 IEEE SENSORS Proceedings > 758 - 761
2010 International Electron Devices Meeting > 7.1.1 - 7.1.4
2009 IEEE Sensors > 45 - 48