Search results
IEEE Journal of Solid-State Circuits > 2017 > 52 > 1 > 218 - 228
IEEE Electron Device Letters > 2016 > 37 > 9 > 1112 - 1115
IEEE Electron Device Letters > 2016 > 37 > 4 > 404 - 407
2015 IEEE International Reliability Physics Symposium > MY.5.1 - MY.5.6
IEEE Electron Device Letters > 2015 > 36 > 2 > 129 - 131
IEEE Transactions on Electron Devices > 2014 > 61 > 5 > 1246 - 1254
IEEE Transactions on Electron Devices > 2013 > 60 > 11 > 3767 - 3774
IEEE Transactions on Electron Devices > 2011 > 58 > 5 > 1483 - 1489
IEEE Transactions on Electron Devices > 2009 > 56 > 7 > 1499 - 1506