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IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 4 > 600 - 607
IEEE Transactions on Electron Devices > 2017 > 64 > 12 > 4928 - 4936
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 11 > 3089 - 3098
IEEE Transactions on Semiconductor Manufacturing > 2017 > 30 > 3 > 236 - 242
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 5 > 1669 - 1680
IEEE Transactions on Computer-Aided Design of Integrated Circuits and... > 2017 > 36 > 4 > 628 - 640