Search results
2009 NORCHIP > 1 - 5
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2008 > 16 > 6 > 733 - 744
2007 2nd International Design and Test Workshop > 145 - 150
2009 NORCHIP > 1 - 5
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2008 > 16 > 6 > 733 - 744
2007 2nd International Design and Test Workshop > 145 - 150