Search results
IEEE Electron Device Letters > 2017 > 38 > 12 > 1704 - 1707
IEEE Transactions on Electron Devices > 2017 > 64 > 3 > 1032 - 1037
IEEE Electron Device Letters > 2017 > 38 > 2 > 240 - 243
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 4 > 667 - 684
IEEE Electron Device Letters > 2016 > 37 > 9 > 1197 - 1200
IEEE Transactions on Microwave Theory and Techniques > 2016 > 64 > 3 > 756 - 766
2015 IEEE International Reliability Physics Symposium > 2E.2.1 - 2E.2.6
IEEE Electron Device Letters > 2011 > 32 > 3 > 312 - 314
IEEE Transactions on Electron Devices > 2011 > 58 > 2 > 466 - 472
IEEE Transactions on Electron Devices > 2010 > 57 > 9 > 2353 - 2357
IEEE Transactions on Electron Devices > 2009 > 56 > 12 > 2895 - 2901
IEEE Transactions on Microwave Theory and Techniques > 2008 > 56 > 12-2 > 3188 - 3192
IEEE Transactions on Electron Devices > 2008 > 55 > 10 > 2554 - 2560