Wyniki wyszukiwania
IEEE Transactions on Circuits and Systems II: Express Briefs > 2017 > 64 > 12 > 1367 - 1371
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 7 > 2118 - 2129
2017 IEEE International Reliability Physics Symposium (IRPS) > EL-1.1 - EL-1.3
2017 IEEE International Reliability Physics Symposium (IRPS) > PM-11.1 - PM-11.4
2017 IEEE International Reliability Physics Symposium (IRPS) > SE-2.1 - SE-2.3
2016 IEEE International Electron Devices Meeting (IEDM) > 28.2.1 - 28.2.4
IEEE Transactions on Computer-Aided Design of Integrated Circuits and... > 2016 > 35 > 9 > 1449 - 1460
IEEE Transactions on Electron Devices > 2016 > 63 > 8 > 3327 - 3334
IEEE Electron Device Letters > 2016 > 37 > 7 > 910 - 912