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IEEE Electron Device Letters > 2017 > 38 > 6 > 712 - 715
IEEE Transactions on Components, Packaging and Manufacturing Technology > 2017 > 7 > 5 > 762 - 767
2017 IEEE International Reliability Physics Symposium (IRPS) > 3F-2.1 - 3F-2.6
IEEE Transactions on Electron Devices > 2016 > 63 > 9 > 3479 - 3486
2016 IEEE International Conference on Dielectrics (ICD) > 1 > 143 - 146
2016 IEEE International Conference on Dielectrics (ICD) > 1 > 159 - 162
2016 IEEE International Reliability Physics Symposium (IRPS) > 4A-5-1 - 4A-5-6
IEEE Transactions on Electron Devices > 2016 > 63 > 4 > 1644 - 1649
IEEE Transactions on Electron Devices > 2016 > 63 > 2 > 723 - 730
IEEE Transactions on Dielectrics and Electrical Insulation > 2016 > 23 > 1 > 266 - 274
2015 IEEE International Electron Devices Meeting (IEDM) > 14.4.1 - 14.4.4
2015 IEEE International Reliability Physics Symposium > 2D.4.1 - 2D.4.7