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IEEE Electron Device Letters > 2018 > 39 > 1 > 79 - 82
IEEE Transactions on Electron Devices > 2017 > 64 > 12 > 4875 - 4881
IEEE Electron Device Letters > 2017 > 38 > 10 > 1441 - 1444
IEEE Electron Device Letters > 2017 > 38 > 10 > 1409 - 1412
IEEE Transactions on Electron Devices > 2017 > 64 > 10 > 4057 - 4064
IEEE Electron Device Letters > 2017 > 38 > 10 > 1421 - 1424
IEEE Electron Device Letters > 2017 > 38 > 10 > 1425 - 1428
IEEE Electron Device Letters > 2017 > 38 > 10 > 1445 - 1448
IEEE Transactions on Electron Devices > 2017 > 64 > 10 > 4050 - 4056
IEEE Transactions on Electron Devices > 2017 > 64 > 9 > 3634 - 3638
IEEE Transactions on Electron Devices > 2017 > 64 > 9 > 3609 - 3615
IEEE Transactions on Electron Devices > 2017 > 64 > 8 > 3139 - 3144
IEEE Transactions on Electron Devices > 2017 > 64 > 7 > 2893 - 2899
IEEE Electron Device Letters > 2017 > 38 > 5 > 615 - 618
IEEE Transactions on Electron Devices > 2017 > 64 > 5 > 2155 - 2160
IEEE Electron Device Letters > 2017 > 38 > 4 > 501 - 504
IEEE Electron Device Letters > 2017 > 38 > 3 > 371 - 374
IEEE Transactions on Electron Devices > 2017 > 64 > 3 > 1197 - 1202