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2016 IEEE International Electron Devices Meeting (IEDM) > 34.1.1 - 34.1.4
2016 IEEE International Electron Devices Meeting (IEDM) > 13.4.1 - 13.4.4
2012 IEEE International Reliability Physics Symposium (IRPS) > MY.3.1 - MY.3.5
OECC 2010 Technical Digest > 694 - 695
2009 International SoC Design Conference (ISOCC) > 220 - 223