Search results for: R. Jock
Quality and Reliability Engineering International > 33 > 3 > 657 - 668
2016 IEEE International Electron Devices Meeting (IEDM) > 34.1.1 - 34.1.4
Frontiers in Statistical Quality Control > Frontiers in Statistical Quality Control 7 > On-line Control > 140-149
Canadian Journal of Statistics > 39 > 2 > 344 - 355
Statistics in Medicine > 29 > 2 > 229 - 235