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IEEE Electron Device Letters > 2015 > 36 > 5 > 430 - 432
2015 IEEE International Reliability Physics Symposium > 3B.3.1 - 3B.3.6
IEEE Transactions on Electron Devices > 2014 > 61 > 8 > 2893 - 2898
2013 IEEE International Reliability Physics Symposium (IRPS) > ER.2.1 - ER.2.6
2013 Spanish Conference on Electron Devices > 281 - 284
IEEE Journal of Solid-State Circuits > 2013 > 48 > 3 > 814 - 826
IEEE Transactions on Device and Materials Reliability > 2012 > 12 > 1 > 78 - 85
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 1 > 126 - 130
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 1 > 81 - 85
IEEE Transactions on Circuits and Systems I: Regular Papers > 2011 > 58 > 9 > 1996 - 2009
IEEE Transactions on Microwave Theory and Techniques > 2010 > 58 > 12-2 > 4004 - 4011
2008 IEEE Custom Integrated Circuits Conference > 121 - 124
2008 IEEE Custom Integrated Circuits Conference > 511 - 514