Search results for: A. Crespo-Yepes
Microelectronic Engineering > 2017 > 178 > C > 289-292
IEEE Electron Device Letters > 2017 > 38 > 4 > 457 - 460
Solid-State Electronics > 2016 > 115 > PB > 140-145
Microelectronic Engineering > 2015 > 147 > C > 176-179
Microelectronics Reliability > 2014 > 54 > 8 > 1500-1510
Microelectronics Reliability > 2013 > 53 > 9-11 > 1247-1251
2013 IEEE International Reliability Physics Symposium (IRPS) > ER.2.1 - ER.2.6
2013 Spanish Conference on Electron Devices > 281 - 284
Solid State Electronics > 2011 > 65-66 > Complete > 157-162
IEEE Electron Device Letters > 2010 > 31 > 6 > 543 - 545
Microelectronics Reliability > 2009 > 49 > 9-11 > 1024-1028