Search results
IEEE Electron Device Letters > 2018 > 39 > 1 > 111 - 114
IEEE Transactions on Electron Devices > 2017 > 64 > 10 > 4018 - 4024
IEEE Transactions on Electron Devices > 2017 > 64 > 8 > 3077 - 3083
IEEE Electron Device Letters > 2017 > 38 > 7 > 867 - 870
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 2 > 349 - 354
IEEE Transactions on Electron Devices > 2017 > 64 > 4 > 1412 - 1417
IEEE Transactions on Electron Devices > 2017 > 64 > 3 > 824 - 831
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 1 > 245 - 252
IEEE Transactions on Nuclear Science > 2017 > 64 > 1-1 > 164 - 169
IEEE Transactions on Electron Devices > 2016 > 63 > 9 > 3642 - 3648
IEEE Transactions on Electron Devices > 2016 > 63 > 6 > 2360 - 2366
IEEE Electron Device Letters > 2016 > 37 > 1 > 35 - 38
2015 IEEE International Electron Devices Meeting (IEDM) > 3.4.1 - 3.4.4
IEEE Transactions on Electron Devices > 2015 > 62 > 6 > 1870 - 1878
IEEE Transactions on Electron Devices > 2015 > 62 > 2 > 546 - 553