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IEEE Electron Device Letters > 2017 > 38 > 7 > 871 - 874
IEEE Transactions on Multi-Scale Computing Systems > 2017 > 3 > 1 > 1 - 11
2016 IEEE International Electron Devices Meeting (IEDM) > 4.2.1 - 4.2.4
IEEE Journal on Emerging and Selected Topics in Circuits and Systems > 2016 > 6 > 3 > 352 - 363
2016 IEEE International Reliability Physics Symposium (IRPS) > 6C-2-1 - 6C-2-5
IEEE Electron Device Letters > 2016 > 37 > 4 > 404 - 407
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2015 > 23 > 11 > 2657 - 2670
IEEE Transactions on Electron Devices > 2015 > 62 > 10 > 3160 - 3167
2015 IEEE International Reliability Physics Symposium > MY.1.1 - MY.1.5
2015 IEEE International Reliability Physics Symposium > 5B.6.1 - 5B.6.6
IEEE Transactions on Information Forensics and Security > 2014 > 9 > 6 > 921 - 932
2013 5th IEEE International Memory Workshop > 100 - 103
2013 IEEE International Reliability Physics Symposium (IRPS) > MY.8.1 - MY.8.5