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Motivated by the recent success of the algebraic computation technique in formal verification of large and optimized gate-level multipliers, this paper proposes algebraic equivalence checking for handling circuits that contain both complex arithmetic components as well as control logic. These circuits pose major challenges for existing proof techniques. The basic idea of Algebraic Combinational Equivalence...
Formal verification utilizing symbolic computer algebra has demonstrated the ability to formally verify large Galois field arithmetic circuits and basic architectures of integer arithmetic circuits. The technique models the circuit as Gröbner basis polynomials and reduces the polynomial equation of the circuit specification wrt. the polynomials model. However, during the Gröbner basis reduction, the...
As we move to smaller CMOS technologies, the need for better testing techniques arises. We investigate the effectiveness of four testing techniques against resistive-open defects. The tests are applied to two adder topologies, namely the quasi-clocked adder and the bridge-style adder. The tests are done under full process variations for technologies down to 16nm. The test techniques based on dynamic...
Major proportion of the manufacturing cost of digital circuits is devoted to testing part. Reduction in the number of tests lowers the manufacturing cost and market price of digital circuits. The main focus of this research work is to minimize the number of tests performed to find faults in combinational circuits. The authors framed a new technique comprising of three phases. The first phase identifies...
In this paper, we investigate the effectiveness of different testing techniques in detecting resistive-open defects for adder circuits implemented using current and future CMOS technologies down to 22nm. We take into consideration the wide process variations associated with such technologies. The first method is based on monitoring various characteristics of the transient power supply and ground currents...
In this paper, a novel built-in sensor (BIS) for digital CMOS circuit testing has been proposed. The proposed BIS has no voltage degradation and it is able to detect, identify and localize both open and short circuit faults. Moreover, it has a simple realization with very small area and detection time. A 4×4 multiplier cell is tested by the proposed BIS and all injected faults are detected.
A new methodology for radiation induced real-time fault detection and diagnosis, utilizing FPGA-based architectures was developed. The methodology includes a full test platform to evaluate a circuit while under radiation and an algorithm to detect and diagnose fault locations within a circuit using Triple Design Triple Modular Redundancy (TDTMR). An analysis of the system was established using a fault...
This paper presents a c-testable motion estimation (CTME) design to efficiently detect the faults in process elements (PEs). The goal of the CTME design is to offer high reliability for video coding systems. The proposed CTME was carried out by Verilog HDL and synthesized with the TSMC 0.18 mum CMOS technology. Logic simulation results show that the proposed CTME guarantees 100% fault coverage with...
Level-testability of multi-operand adders consisting of carry save adders is shown by showing test design for them. A multi-operand adder is a main part of a multiplier. 6L+2 patterns are sufficient to test a multi-operand adder under cell fault model, where L denotes the depth of the multi-operand adder. A test method of the multi-operand adder used as a partial product compressor in a multiplier...
We propose a built-in scheme for generating all patterns of a given deterministic test set T. The scheme is based on grouping the columns of T, so that in each group of columns the number ri of unique representatives (row subvectors) as well as their product R over all such groups is kept at a minimum. The representatives of each group (segment) are then generated by a small finite state machine (FSM)...
Present and future semiconductor technologies are characterized by increasing parameters variations as well as an increasing susceptibility to external disturbances. Transient errors during system operation are no longer restricted to memories but also affect random logic, and a robust design becomes mandatory to ensure a reliable system operation. Self-checking circuits rely on redundancy to detect...
In many DSP applications (image and voice processing, baseband symbol decoding in high quality communication channels) several dBs of SNR loss can be tolerated without noticeable impact on system level performance. For power optimization in such applications, voltage overscaling can be used to operate the arithmetic circuitry slower than the critical circuit path delay while incurring tolerable SNR...
A novel scheme for reducing the test application time in accumulator-based test-pattern generation is presented. The proposed scheme exhibits extremely low demand for hardware. It is based on a decoder whose inputs are driven by a very slow external tester. Experimental results on ISCAS benchmarks substantiate a test-time reduction of 75%-95% when compared to previously published test-set embedding...
In this paper, we present a systematic method for the designing fault tolerant reversible arithmetic circuits for finite field or Galois fields of the form GF(2m). To tackle the problem of errors in computation, we propose error detection and correction using multiple parity prediction technique based on low density parity check (LDPC) code. For error detection and correction, we need additional garbage...
Polymorphic gates can be considered as a new reconfigurable technology capable of integrating logic functions with sensing in a single compact structure. Polymorphic gates whose logic function can be controlled by the level of the power supply voltage (Vdd) represent a special class of polymorphic gates. A new polymorphic NAND/NOR gate controlled by Vdd is presented. This gate was fabricated and utilized...
Software-based self-test (SBST) has emerged as an effective strategy for non-concurrent on-line testing of processors integrated in embedded system applications. It offers the potential for on-line testing without any hardware overhead. However, test generation is usually based in a semi-automated approach and gate-level information is required for effective test program generation.In this paper we...
The use of multiple voltages for different cores is becoming a widely accepted technique for efficient power management. Level shifters are used as interfaces between voltage domains. Through extensive transistor level simulations of resistive open, bridging and resistive short faults, we have classified the testing of level shifters into PASSIVE and ACTIVE modes. We examine if high test coverage...
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