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IEEE Journal of the Electron Devices Society > 2018 > 6 > 1 > 41 - 48
IEEE Electron Device Letters > 2018 > 39 > 1 > 95 - 98
IEEE Journal of Solid-State Circuits > 2018 > 53 > 1 > 124 - 133
IEEE Electron Device Letters > 2017 > 38 > 12 > 1676 - 1679
IEEE Transactions on Electron Devices > 2017 > 64 > 11 > 4457 - 4465
IEEE Electron Device Letters > 2017 > 38 > 11 > 1543 - 1546
IEEE Transactions on Nuclear Science > 2017 > 64 > 10 > 2639 - 2647
IEEE Electron Device Letters > 2017 > 38 > 10 > 1394 - 1397
IEEE Electron Device Letters > 2017 > 38 > 10 > 1500 - 1503
IEEE Transactions on Nuclear Science > 2017 > 64 > 10 > 2633 - 2638
IEEE Transactions on Electron Devices > 2017 > 64 > 10 > 4114 - 4122
IEEE Electron Device Letters > 2017 > 38 > 10 > 1390 - 1393
IEEE Electron Device Letters > 2017 > 38 > 10 > 1433 - 1436
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 3 > 526 - 530