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IEEE Journal of Solid-State Circuits > 2017 > 52 > 1 > 218 - 228
IEEE Transactions on Electron Devices > 2014 > 61 > 6 > 2136 - 2144
2013 IEEE International Reliability Physics Symposium (IRPS) > MY.5.1 - MY.5.4
IEEE Electron Device Letters > 2010 > 31 > 11 > 1287 - 1289
IEEE Electron Device Letters > 2010 > 31 > 11 > 1293 - 1295