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2011 International Reliability Physics Symposium > 4E.5.1 - 4E.5.5
2010 International Electron Devices Meeting > 4.1.1 - 4.1.4
IEEE Transactions on Electron Devices > 2010 > 57 > 10 > 2363 - 2380
IEEE Transactions on Electron Devices > 2008 > 55 > 12 > 3432 - 3441