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IEEE Journal of Solid-State Circuits > 2017 > 52 > 12 > 3312 - 3328
IEEE Transactions on Electron Devices > 2017 > 64 > 10 > 4084 - 4090
IEEE Transactions on Nuclear Science > 2017 > 64 > 1-1 > 512 - 518
IEEE Electron Device Letters > 2016 > 37 > 10 > 1268 - 1271
IEEE Transactions on Magnetics > 2016 > 52 > 8 > 1 - 4
2016 IEEE International Reliability Physics Symposium (IRPS) > SE-5-1 - SE-5-6