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IEEE Transactions on Device and Materials Reliability > 2013 > 13 > 4 > 515 - 523
2011 International Reliability Physics Symposium > PL.1.1 - PL.1.5
2010 3rd International Nanoelectronics Conference (INEC) > 1167 - 1168
IEEE Transactions on Electron Devices > 2009 > 56 > 8 > 1681 - 1689