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2012 International Electron Devices Meeting > 5.1.1 - 5.1.4
IEEE Transactions on Electron Devices > 2011 > 58 > 4 > 1045 - 1053
IEEE Transactions on Computers > 2010 > 59 > 9 > 1172 - 1186
IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 3 > 412 - 418