Wyniki wyszukiwania
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 3 > 298 - 303
IEEE Electron Device Letters > 2014 > 35 > 5 > 551 - 553
IEEE Transactions on Microwave Theory and Techniques > 2011 > 59 > 3 > 652 - 659
IEEE Transactions on Electron Devices > 2009 > 56 > 8 > 1681 - 1689
IEEE Sensors Journal > 2008 > 8 > 7 > 1324 - 1329