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IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 2 > 135 - 144
IEEE Electron Device Letters > 2009 > 30 > 4 > 340 - 342
IEEE Transactions on Instrumentation and Measurement > 2008 > 57 > 8 > 1786 - 1790
IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 2 > 135 - 144
IEEE Electron Device Letters > 2009 > 30 > 4 > 340 - 342
IEEE Transactions on Instrumentation and Measurement > 2008 > 57 > 8 > 1786 - 1790