Search results
IEEE Journal of the Electron Devices Society > 2018 > 6 > 1 > 85 - 94
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2018 > 26 > 1 > 1 - 10
IEEE Electron Device Letters > 2018 > 39 > 1 > 95 - 98
IEEE Electron Device Letters > 2018 > 39 > 1 > 75 - 78
IEEE Electron Device Letters > 2018 > 39 > 1 > 67 - 70
IEEE Transactions on Electron Devices > 2018 > 65 > 1 > 31 - 37
IEEE Transactions on Electron Devices > 2018 > 65 > 1 > 299 - 307
IEEE Electron Device Letters > 2018 > 39 > 1 > 71 - 74
IEEE Transactions on Electron Devices > 2018 > 65 > 1 > 282 - 289
IEEE Transactions on Electron Devices > 2018 > 65 > 1 > 11 - 18
IEEE Electron Device Letters > 2017 > 38 > 12 > 1653 - 1656
IEEE Transactions on Electron Devices > 2017 > 64 > 11 > 4607 - 4614
IEEE Transactions on Electron Devices > 2017 > 64 > 11 > 4587 - 4593
IEEE Transactions on Electron Devices > 2017 > 64 > 11 > 4393 - 4399
IEEE Transactions on Electron Devices > 2017 > 64 > 11 > 4731 - 4737
IEEE Electron Device Letters > 2017 > 38 > 11 > 1520 - 1523
IEEE Transactions on Electron Devices > 2017 > 64 > 11 > 4400 - 4407
IEEE Transactions on Electron Devices > 2017 > 64 > 11 > 4503 - 4509
IEEE Micro > 2017 > 37 > 6 > 20 - 29