Search results for: Frederic Monsieur
IEEE Transactions on Electron Devices > 2018 > 65 > 1 > 11 - 18
Microelectronics Reliability > 2016 > 63 > C > 90-96
IEEE Electron Device Letters > 2010 > 31 > 12 > 1452 - 1454
IEEE Transactions on Electron Devices > 2018 > 65 > 1 > 11 - 18
Microelectronics Reliability > 2016 > 63 > C > 90-96
IEEE Electron Device Letters > 2010 > 31 > 12 > 1452 - 1454