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IEEE Electron Device Letters > 2017 > 38 > 9 > 1294 - 1297
IEEE Electron Device Letters > 2017 > 38 > 4 > 497 - 500
IEEE Electron Device Letters > 2017 > 38 > 1 > 91 - 94
2016 IEEE International Reliability Physics Symposium (IRPS) > CD-5-1 - CD-5-4
IEEE Electron Device Letters > 2016 > 37 > 4 > 377 - 380
IEEE Transactions on Electron Devices > 2016 > 63 > 4 > 1450 - 1458
IEEE Transactions on Electron Devices > 2016 > 63 > 1 > 318 - 325
IEEE Electron Device Letters > 2015 > 36 > 8 > 754 - 756
IEEE Electron Device Letters > 2015 > 36 > 4 > 381 - 383
IEEE Transactions on Electron Devices > 2015 > 62 > 3 > 776 - 781
IEEE Transactions on Electron Devices > 2015 > 62 > 2 > 512 - 518
IEEE Electron Device Letters > 2014 > 35 > 7 > 732 - 734
IEEE Electron Device Letters > 2014 > 35 > 9 > 903 - 905