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IEEE Journal of the Electron Devices Society > 2018 > 6 > 1 > 26 - 33
IEEE Transactions on Power Electronics > 2018 > 33 > 2 > 1585 - 1596
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2018 > 26 > 1 > 201 - 205
IEEE Electron Device Letters > 2018 > 39 > 1 > 147 - 150
IEEE Journal of Solid-State Circuits > 2018 > 53 > 1 > 155 - 163
IEEE Transactions on Instrumentation and Measurement > 2018 > 67 > 1 > 24 - 32
IEEE Transactions on Electron Devices > 2018 > 65 > 1 > 356 - 360
IEEE Transactions on Electron Devices > 2018 > 65 > 1 > 79 - 86
IEEE Transactions on Electron Devices > 2018 > 65 > 1 > 150 - 157
IEEE Transactions on Electron Devices > 2018 > 65 > 1 > 38 - 44
IEEE Transactions on Electron Devices > 2018 > 65 > 1 > 122 - 128
IEEE Journal of Solid-State Circuits > 2018 > 53 > 1 > 229 - 235
IEEE Transactions on Electron Devices > 2018 > 65 > 1 > 19 - 22
IEEE Transactions on Computer-Aided Design of Integrated Circuits and... > 2018 > 37 > 1 > 123 - 132
IEEE Transactions on Circuits and Systems II: Express Briefs > 2018 > 65 > 1 > 41 - 45
IEEE Transactions on Circuits and Systems II: Express Briefs > 2018 > 65 > 1 > 101 - 105
IEEE Electron Device Letters > 2017 > 38 > 12 > 1673 - 1675
IEEE Transactions on Circuits and Systems I: Regular Papers > 2017 > 64 > 12 > 3036 - 3046
IEEE Transactions on Circuits and Systems II: Express Briefs > 2017 > 64 > 12 > 1417 - 1421
IEEE Electron Device Letters > 2017 > 38 > 12 > 1724 - 1727