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IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2018 > 26 > 1 > 50 - 62
IEEE Transactions on Electron Devices > 2017 > 64 > 10 > 4084 - 4090
IEEE Transactions on Electron Devices > 2017 > 64 > 9 > 3639 - 3646
IEEE Transactions on Computer-Aided Design of Integrated Circuits and... > 2017 > 36 > 7 > 1181 - 1192
IEEE Transactions on Computers > 2017 > 66 > 5 > 786 - 798
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 1 > 213 - 220
IEEE Transactions on Computers > 2017 > 66 > 3 > 531 - 544
IEEE Transactions on Electron Devices > 2017 > 64 > 1 > 121 - 129
IEEE Magnetics Letters > 2017 > 8 > 1 - 5
IEEE Transactions on Reliability > 2016 > 65 > 4 > 1755 - 1768
2016 IEEE International Electron Devices Meeting (IEDM) > 27.4.1 - 27.4.4