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2011 International Reliability Physics Symposium > PL.1.1 - PL.1.5
IEEE Electron Device Letters > 2011 > 32 > 4 > 449 - 451
IEEE Transactions on Industrial Electronics > 2011 > 58 > 1 > 21 - 28
2010 International Electron Devices Meeting > 34.3.1 - 34.3.4
IEEE Electron Device Letters > 2010 > 31 > 11 > 1178 - 1180