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IEEE Transactions on Electron Devices > 2017 > 64 > 10 > 4018 - 4024
2016 IEEE International Reliability Physics Symposium (IRPS) > XT-7-1 - XT-7-5
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 3 > 352 - 358
2013 IEEE International Electron Devices Meeting > 26.2.1 - 26.2.4
IEEE Transactions on Electron Devices > 2012 > 59 > 11 > 3133 - 3136
IEEE Electron Device Letters > 2012 > 33 > 3 > 438 - 440
2011 International Reliability Physics Symposium > PL.1.1 - PL.1.5
2011 International Reliability Physics Symposium > XT.8.1 - XT.8.6
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 2 > 290 - 294
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 1 > 126 - 130
2010 International Electron Devices Meeting > 4.7.1 - 4.7.4
2010 IEEE International Reliability Physics Symposium > 1078 - 1081
2010 IEEE International Reliability Physics Symposium > 1044 - 1048