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IEEE Electron Device Letters > 2017 > 38 > 9 > 1252 - 1255
2017 IEEE International Reliability Physics Symposium (IRPS) > DG-8.1 - DG-8.5
IEEE Transactions on Electron Devices > 2016 > 63 > 9 > 3487 - 3492
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 2 > 183 - 193
2016 IEEE International Reliability Physics Symposium (IRPS) > CD-3-1 - CD-3-6
IEEE Electron Device Letters > 2015 > 36 > 4 > 300 - 302
IEEE Transactions on Emerging Topics in Computing > 2016 > 4 > 3 > 335 - 348
IEEE Transactions on Electron Devices > 2014 > 61 > 7 > 2243 - 2249
2013 IEEE International Electron Devices Meeting > 15.4.1 - 15.4.4