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IEEE Transactions on Device and Materials Reliability > 2012 > 12 > 1 > 146 - 151
EOS/ESD Symposium Proceedings > 1 - 10
IEEE Transactions on Electron Devices > 2008 > 55 > 9 > 2287 - 2296
IEEE Transactions on Device and Materials Reliability > 2012 > 12 > 1 > 146 - 151
EOS/ESD Symposium Proceedings > 1 - 10
IEEE Transactions on Electron Devices > 2008 > 55 > 9 > 2287 - 2296