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IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2016 > 24 > 7 > 2438 - 2448
IEEE Electron Device Letters > 2015 > 36 > 4 > 300 - 302
2012 IEEE International Reliability Physics Symposium (IRPS) > XT.5.1 - XT.5.6
IEEE Transactions on Computer-Aided Design of Integrated Circuits and... > 2011 > 30 > 9 > 1321 - 1334
2010 International Electron Devices Meeting > 4.5.1 - 4.5.4