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2011 International Reliability Physics Symposium > XT.8.1 - XT.8.6
2010 International Electron Devices Meeting > 20.6.1 - 20.6.4
IEEE Electron Device Letters > 2010 > 31 > 11 > 1263 - 1265
IEEE Electron Device Letters > 2010 > 31 > 9 > 1032 - 1034
IEEE Transactions on Electron Devices > 2010 > 57 > 3 > 690 - 695
IEEE Electron Device Letters > 2008 > 29 > 7 > 743 - 745
IEEE Transactions on Electron Devices > 2007 > 54 > 6 > 1330 - 1337
IEEE Electron Device Letters > 2007 > 28 > 8 > 682 - 684