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Electronics Letters > 2017 > 53 > 20 > 1373 - 1375
IET Micro & Nano Letters > 2015 > 10 > 10 > 541 - 544
2011 International Reliability Physics Symposium > 2E.2.1 - 2E.2.8
2011 International Reliability Physics Symposium > 2F.4.1 - 2F.4.6
IEEE Transactions on Components, Packaging and Manufacturing Technology > 2011 > 1 > 3 > 359 - 366
IEEE Transactions on Electron Devices > 2011 > 58 > 5 > 1570 - 1574
IEEE Transactions on Reliability > 2011 > 60 > 1 > 219 - 233
IEEE Transactions on Electron Devices > 2011 > 58 > 4 > 1170 - 1175
IEEE Transactions on Electron Devices > 2011 > 58 > 1 > 224 - 228
IEEE Transactions on Electron Devices > 2011 > 58 > 1 > 271 - 275
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 2 > 219 - 226
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 2 > 227 - 235
2010 International Electron Devices Meeting > 20.3.1 - 20.3.4