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2011 International Reliability Physics Symposium > 2E.3.1 - 2E.3.5
IEEE Electron Device Letters > 2011 > 32 > 3 > 321 - 323
IEEE Transactions on Electron Devices > 2011 > 58 > 9 > 3034 - 3041
IEEE Transactions on Electron Devices > 2010 > 57 > 11 > 3186 - 3189
IEEE Transactions on Device and Materials Reliability > 2010 > 10 > 1 > 62 - 70
IEEE Electron Device Letters > 2010 > 31 > 8 > 815 - 817
IEEE Electron Device Letters > 2009 > 30 > 3 > 231 - 233
IEEE Electron Device Letters > 2009 > 30 > 4 > 377 - 379