Search results
Journal of Microelectromechanical Systems > 2017 > 26 > 4 > 846 - 858
IEEE Electron Device Letters > 2014 > 35 > 7 > 696 - 698
IEEE Transactions on Nuclear Science > 2013 > 60 > 4-1 > 2574 - 2582
IEEE Transactions on Electron Devices > 2011 > 58 > 11 > 4024 - 4034
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 3 > 426 - 432
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 3 > 417 - 425