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2011 International Reliability Physics Symposium > 2F.4.1 - 2F.4.6
IEEE Electron Device Letters > 2011 > 32 > 3 > 252 - 254
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 2 > 290 - 294
IEEE Transactions on Electron Devices > 2011 > 58 > 4 > 1170 - 1175
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 2 > 227 - 235
2009 IEEE Symposium on Industrial Electronics&Applications > 2 > 872 - 876
IEEE Sensors Journal > 2008 > 8 > 7 > 1324 - 1329