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2011 International Reliability Physics Symposium > 3D.4.1 - 3D.4.7
IEEE Transactions on Electron Devices > 2011 > 58 > 3 > 672 - 676
2010 International Electron Devices Meeting > 33.3.1 - 33.3.4
2010 IEEE MTT-S International Microwave Symposium > 1138 - 1141
IEEE Electron Device Letters > 2010 > 31 > 8 > 875 - 877
IEEE Electron Device Letters > 2010 > 31 > 2 > 114 - 116
IEEE Electron Device Letters > 2010 > 31 > 7 > 749 - 751
IEEE Transactions on Nuclear Science > 2009 > 56 > 5-2 > 2916 - 2924
IEEE Electron Device Letters > 2009 > 30 > 7 > 715 - 717
Electronics Letters > 2008 > 44 > 6 > 411 - 412
IEEE Electron Device Letters > 2008 > 29 > 10 > 1105 - 1107