Search results
IEEE Journal of the Electron Devices Society > 2018 > 6 > 1 > 68 - 73
IEEE Journal of the Electron Devices Society > 2018 > 6 > 1 > 110 - 115
IEEE Electron Device Letters > 2018 > 39 > 1 > 51 - 54
IEEE Photonics Technology Letters > 2018 > 30 > 1 > 59 - 62
IEEE Electron Device Letters > 2017 > 38 > 11 > 1575 - 1578
IEEE Electron Device Letters > 2017 > 38 > 11 > 1513 - 1515
IEEE Transactions on Electron Devices > 2017 > 64 > 10 > 3998 - 4001
IEEE Electron Device Letters > 2017 > 38 > 9 > 1309 - 1312
IEEE Transactions on Electron Devices > 2017 > 64 > 9 > 3595 - 3600
IEEE Transactions on Electron Devices > 2017 > 64 > 9 > 3919 - 3926
IEEE Electron Device Letters > 2017 > 38 > 9 > 1294 - 1297
IEEE Transactions on Electron Devices > 2017 > 64 > 7 > 2789 - 2796
IEEE Transactions on Electron Devices > 2017 > 64 > 7 > 3023 - 3027
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 2 > 349 - 354
IEEE Transactions on Electron Devices > 2017 > 64 > 6 > 2519 - 2525
IEEE Electron Device Letters > 2017 > 38 > 6 > 756 - 759
IEEE Transactions on Electron Devices > 2017 > 64 > 4 > 1412 - 1417
IEEE Electron Device Letters > 2017 > 38 > 4 > 497 - 500
IEEE Transactions on Electron Devices > 2017 > 64 > 3 > 1323 - 1329
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 1 > 80 - 89