Search results
IEEE Electron Device Letters > 2018 > 39 > 1 > 71 - 74
IEEE Transactions on Electron Devices > 2017 > 64 > 8 > 3511 - 3514
IEEE Journal of the Electron Devices Society > 2016 > 4 > 5 > 278 - 285
IEEE Transactions on Electron Devices > 2016 > 63 > 8 > 3084 - 3087
IEEE Transactions on Electron Devices > 2015 > 62 > 11 > 3547 - 3553
IEEE Transactions on Semiconductor Manufacturing > 2015 > 28 > 3 > 266 - 271
IEEE Journal of Emerging and Selected Topics in Power Electronics > 2015 > 3 > 2 > 542 - 554
IEEE Transactions on Electron Devices > 2015 > 62 > 5 > 1456 - 1459
IEEE Electron Device Letters > 2015 > 36 > 5 > 451 - 453
2015 IEEE International Reliability Physics Symposium > 3E.4.1 - 3E.4.5
IEEE Electron Device Letters > 2014 > 35 > 9 > 900 - 902
IEEE Transactions on Electron Devices > 2014 > 61 > 11 > 3833 - 3837
IEEE Transactions on Device and Materials Reliability > 2013 > 13 > 4 > 524 - 533