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IEEE Transactions on Electron Devices > 2013 > 60 > 3 > 992 - 997
Proceedings of the 29th Chinese Control Conference > 4116 - 4121
IEEE Electron Device Letters > 2010 > 31 > 5 > 396 - 398
2009 IEEE International Reliability Physics Symposium > 1005 - 1010
2009 Spanish Conference on Electron Devices > 285 - 288