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IEEE Electron Device Letters > 2011 > 32 > 3 > 318 - 320
IEEE Transactions on Device and Materials Reliability > 2010 > 10 > 4 > 427 - 436
IEEE Transactions on Electron Devices > 2010 > 57 > 8 > 1924 - 1929
2009 Spanish Conference on Electron Devices > 242 - 245
IEEE Transactions on Electron Devices > 2009 > 56 > 12 > 2895 - 2901