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2016 IEEE International Electron Devices Meeting (IEDM) > 32.6.1 - 32.6.4
IEEE Transactions on Electron Devices > 2014 > 61 > 10 > 3448 - 3455
IMPACT-2013 > 185 - 188
2016 IEEE International Electron Devices Meeting (IEDM) > 32.6.1 - 32.6.4
IEEE Transactions on Electron Devices > 2014 > 61 > 10 > 3448 - 3455
IMPACT-2013 > 185 - 188